11th IEEE International On-Line Testing Symposium
Mercure Hotel, Saint Raphael, French Riviera, France July 6-8, 2005

General Chairs Michael Nicolaidis, iRoC Technologies Lorena Anghel, TIMA Laboratory Program Chairs Cecilia Metra, Bologna University Kaushik Roy, Purdue University Vice General Chairs Yervant Zorian, Virage Logic Dimitris Gizopoulos, Piraeus University Vice Program Chairs Régis Leveugle, TIMA Laboratory João Paulo Teixeira, IST/INESC-ID Local Chair Raoul Velazco, TIMA Laboratory Publicity Chair Daniele Rossi, Bologna University Publications Chair Swarup Bhunia, Purdue University Audio Visual Chair Michele Portolan, TIMA Laboratory Industrial Liaison E. Dupont, iRoC Technologies ETTTC Liaison Joan Figueras, U.P. de Catalunya

Preliminary Call for Papers Issues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips. The Symposium is sponsored by the IEEE Computer Society, Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory, University of Bologna, Purdue University and IRoC Technologies. The topics include (but are not limited to) the following ones: Reliability issues in nanometer technologies. Field diagnosis, maintainability and reconfiguration. Security issues in cryptographic chips. On-line testing in automotive, railway, avionics and industrial control. On-line test in the continuous operation of large systems. On-line testing of analog and mixed signal circuits. Self-checking circuits and coding theory. On-line and off-line BIST. Synthesis of on-line testable circuits. Radiation effects. Fault-tolerant and fail-safe systems. On-line power monitoring and control. On-line monitoring of current, temperature and other reliability indicators. Reliability evaluation. Submissions: The IOLTS Program Committee invites authors to submit papers in the above areas. All submissions should have a title page with the name, address, phone number, fax number and e-mail address of a contact author. Accepted papers will be included in a formal Proceedings to be published by the IEEE. For updated submission information please visit the web site. For submissions, please contact: Kaushik Roy Purdue University 1285, Electrical Engineering Building, West Lafayette IN 47907-1285, USA Tel.: +1 765 494 2361 Fax: +1 765 494 3371 Please observe the following key dates: Submission deadline ............ February 1st, 2005. Notification of acceptance ... March 25th, 2005. General Information: Lorena Anghel TIMA Laboratory 46, avenue Felix Viallet 38031 Grenoble Cedex France Tel.: +33 4 76 57 46 96 Fax: +33 4 76 47 38 14 Michael Nicolaidis iRoC Technologies World Trade Center, BP 1510 38025 Grenoble Cedex France Tel.: +33 4 3812 0763 Fax: +33 4 3812 9615

Test Technology Technical Council