12th IEEE International On-Line Testing Symposium
Lake of Como, Italy
July 10-12, 2006.
General Chairs
C. Metra, Bologna University
M. Nicolaidis, TIMA Laboratory

Program Chairs
R. Aitken, ARM
R. Leveugle, TIMA Laboratory

Vice General Chairs
L. Anghel, TIMA Laboratory
Y. Zorian, Virage Logic

Vice Program Chairs
T.M. Mak, Intel
K. Roy, Purdue U.

Local Chair
M. Omana, U. Bologna

Financial Chair
D. Rossi, U. Bologna

Publicity Chair
C. Lazzari, TIMA Laboratory

Publications Chair
M. Portolan, TIMA Laboratory

Audio Visual Chair
V. Maingot, TIMA Laboratory

ETTTC Liaison
Z. Peng, Linköping U.

Program Committee
J. Abraham, U. Texas at Austin
R. Baumann, Texas Instruments
E. Boehl, Robert Bosch GmbH
C. Bolchini, Politec. di Milano
D. Bradley, ARM UK
N. Buard, EADS
S. Chakravarty, Intel
Y. Crouzet, LAAS
A. Dandache, U. Metz
P. Fouillat, IXL-ENSEIRB
P. Girard, LIRMM
D. Gizopoulos, Piraeus U.
M. Goessel, U. Postdam
Th. Haniotakis, U. Southern Illinois
J. Hayes, U. Michigan
T. Heijmen, Philips Research Labs
S. Hellebrand, U. Innsbruck
A. Ivanov, U. Brit. Columbia
R. Iyer, U. Southern Illinois
A. Krasniewski, Warsaw U.T.
C. Landrault, LIRMM
A. Lemarechal, Oberthur Card Systems
I. Levin, U. Tel Aviv
H. Manhaeve, QStar
S. Mitra, Standford U.
D. Nikolos, U. Patras
A. Orailoglu, U. Cal. San Diego
I. Parulkar, SUN
A. Paschalis, U. Athens
M. Pflanz, IBM Germany
S. Piestrak, U. Metz
M. Pignol, CNES
D. Pradhan, U. Bristol
P. Prinetto, Politec. di Torino
M. Rebaudengo, Politec. di Torino
P. Sanda, IBM
J. Segura, U. Illes Balears
J.P. Seifert, Intel
N. Seifert, Intel
E. Simeu, TIMA Laboratory
M. Sonza Reorda, Politec. di Torino
J. Sosnowski, Warsaw U.T.
L. Sourgen, STMicroelectronics
G. Stamoulis, U. Crete
B. Straube, Fraunhofer IIS/EAS
J.P. Teixeira, IST/INESC-ID
N.A. Touba, U. Texas
S. Tragoudas, U. Southern Illinois
Y. Tsiatouhas, ISD
F. Vargas, PUCRS
R. Velazco, TIMA Laboratory
I. Verbauwhede, K.U. Leuven
H.T. Vierhaus, Brandenburg T.U.
M. Violante, Politec. di Torino
H.J. Wunderlich, U. Stuttgart

Call for Papers

Issues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies adversely impact noise margins and make integrating on-line test mandatory in many modern ICs. The Symposium is also emphasizing on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.
The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory, and University of Bologna.

The topics include (but are not limited to) the following ones:
•  Reliability issues in nanometer technologies
•  Field diagnosis, maintainability and reconfiguration
•  Secure circuit design
•  On-line testing of analog and mixed signal circuits
•  On-line test in the continuous operation of large systems
•  On-line testing in automotive, railway and avionics
•  On-line testing in industrial control
•  Fault-based attacks and counter measures
•  Self-checking circuits and coding theory
•  On-line and off-line BIST
•  Synthesis of on-line testable circuits
•  Radiation effects
•  Fault-tolerant and fail-safe Systems
•  On-line power monitoring and control
•  On-line monitoring of current, temperature and other reliability indicators
•  Dependability evaluation

Submissions:
The IOLTS Program Committee invites authors to submit papers in the above areas. All submissions should have a title page with the name, address, phone number, fax number, and e-mail address of the contact author. Accepted papers will be included in formal Proceedings to be published by the IEEE.
Papers must be submitted electronically in PDF via the Symposium Web site.

Please observe the following key date:
Submission deadline:   February 10th, 2006.
Notification of acceptance:   March 25th, 2006.

Location:
Como Lake is the third biggest Italian lake. A few kilometers from the Switzerland border, from the Milan Malpensa airport and from Milan, it is easily reachable by air (with direct flights to Malpensa from all major international airports), by car, as well as by train. It is situated in a unique and rich environment, where within a few miles of industrial areas you can find the mountains, the lake, and the beautiful valleys of the Alps.

Submission Information:
Régis Leveugle
TIMA Laboratory
46, av. Félix Viallet
38031 Grenoble - France
Tel: +33 (0) 4 76 57 46 86
Fax: +33 (0) 4 76 47 38 14

General Information:
Cécilia Metra
University of Bologna
Viale Risorgimento 2
40136 Bologna - Italy
Tel: +39 051 2093038
Fax: +39 051 2093073
Michael Nicolaidis
TIMA Laboratory
46, av. Félix Viallet
38031 Grenoble - France
Tel: +33 (0) 4 76 57 46 96
Fax: +33 (0) 4 76 47 38 14
Download (76ko) or this first call for papers.

IEEE Computer Society

Test Technology Technical Council
©2006 Laboratoire TIMA.
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