13th IEEE International On-Line Testing Symposium Hersonissos-Heraklion, Crete, Greece
July 8-11, 2007.
General Chairs
M. Nicolaidis, TIMA Laboratory
A. Paschalis, , U. Athens

Program Chairs
D. Gizopoulos, , U.Piraeus
T.M. Mak, Intel

Vice General Chairs
C. Metra, U. Bologna
Y. Zorian, Virage Logic

Vice Program Chairs
R. Aitken, ARM
R. Leveugle, TIMA Laboratory

Local Chair
N. Kranitis, U. Athens

Finance Chair
M. Psarakis, U. Piraeus

Panels Chair
L. Anghel, TIMA Laboratory

Publicity Chair
R. Velazco, TIMA Laboratory

Publications Chair
E. Simeu, TIMA Laboratory

Audio Visual Chair
G. Xenoulis, U. Piraeus

ETTTC Liaison
Z. Peng, Linköping U.

Program Committee
J. Abraham, U. Texas at Austin
R. Baumann, Texas Instruments
E. Boehl, Robert Bosch GmbH
C. Bolchini, Politec. di Milano
D. Bradley, ARM UK
A. Bystrov, U. Newcastle
S. Chakravarty, LSI Logic
Y. Crouzet, LAAS
A. Dandache, U. Metz
P. Fouillat, IXL-ENSEIRB
P. Girard, LIRMM
M. Goessel, U. Postdam
T. Haniotakis, U. Southern Illinois
J. Hayes, U. Michigan
T. Heijmen, NXP Semiconductors
S. Hellebrand, U. Paderborn
A. Ivanov, U. Brit. Columbia
R. Iyer, U. Illinois Urbana
H. Konuk, Broadcom
A. Krasniewski, Warsaw U.T.
S. Kundu, U. Mass. Amherst
C. Landrault, LIRMM
Y. Makris, Yale U.
S. Mitra, Standford U.
D. Nikolos, U. Patras
P. Pande, Washington State U.
I. Parulkar, SUN
B. Paul, Toshiba
M. Pflanz, IBM Germany
S. Piestrak, U. Metz
M. Pignol, CNES
D. Pradhan, U. Bristol
P. Prinetto, Politec. di Torino
M. Rebaudengo, Politec. di Torino
K. Roy, Purdue U.
P. Sanda, IBM
J. Segura, U. Illes Balears
J.P. Seifert, U. of Innsbruck
N. Seifert, Intel
M. Sonza Reorda, Politec. di Torino
J. Sosnowski, Warsaw U.T.
L. Sourgen, STMicroelectronics
B. Straube, Fraunhofer IIS/EAS
J.P. Teixeira, IST/INESC-ID
N. Touba, U. Texas
S. Tragoudas, U. Southern Illinois
Y. Tsiatouhas, U. Ioannina
F. Vargas, PUCRS
I. Verbauwhede, K.U. Leuven
M. Violante, Politec. di Torino
A. Wood, Sun
H.J. Wunderlich, U. Stuttgart
M. Zhang, Intel

Call for Papers

Issues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins and process parameters variations and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.
The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and organized by TIMA Laboratory, University of Athens and University of Piraeus.

The topics include (but are not limited to) the following ones:
•  Reliability issues in nanometer technologies
•  Field diagnosis, maintainability and reconfiguration
•  Secure circuit design
•  On-line testing of analog and mixed signal circuits
•  On-line test in the continuous operation of large systems
•  On-line testing in automotive, railway and avionics
•  On-line testing in industrial control
•  Fault-based attacks and counter measures
•  Self-checking circuits and coding theory
•  On-line and off-line BIST
•  Synthesis of on-line testable circuits
•  Radiation effects
•  Fault-tolerant and fail-safe Systems
•  On-line power monitoring and control
•  On-line current, temperature, etc, monitoring
•  Dependability evaluation

Submissions:
The IOLTS Program Committee invites authors to submit papers in the above or related technical areas. Accepted papers will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically.
The IEEE Transactions on Dependable and Secure Computing (TDSC) is actively soliciting high quality papers in the areas of hardware dependability and security. IOLTS 2007 authors will be invited to submit archival versions of their papers for consideration for publication in IEEE TDSC.

Please observe the following key dates:
Submission deadline:   February 10 2007.
Notification of acceptance:   March 30 2007.
Camera-ready papers due:   April 25 2007.

About the location:
Crete is the fifth largest island in the Mediterranean sea and lies at the point where the continents of Europe, Asia and Africa meet. It has been cultivated for thousands of years and has important Minoan, Greek, Roman and Byzantine archaeological sites. The historical aspects combine with the scenic landscapes of mountains, valleys, and sea to make Crete a beautiful and fascinating area with probably the mildest climate in Europe. IOLTS will be held in Creta Maris Resort on the Cretan Sea that combines Aegean architecture and luxurious facilities. It is situated 24km east of Heraklion International Airport and it is close to the fishing village of Hersonissos, a long sweeping bay of sandy beach and crystal clear water.

Submission Information:
Dimitris Gizopoulos
University of Piraeus
Department of Informatics
80 Karaoli & Dimitriou Str.
18534, Piraeus - Greece
Tel: +30 210 4142372
T.M. Mak
Intel
2200 Mission College Blvd
SC12-604, Santa Clara
CA 95051 - USA
Tel: +1 408-765-4543


General Information:
Antonis Paschalis
University of Athens
Dept. of Informatics & Telecom.
Panepistimiopolis
15784 Athens - Greece
Tel: +30 210 727 5231
Michael Nicolaidis
TIMA Laboratory
46, av. Félix Viallet
38031 Grenoble - France
Tel: +33 (0) 4 76 57 46 96
Download (186ko) or this first call for papers.


IEEE Computer Society

Test Technology Technical Council
©2007 Laboratoire TIMA.
Tous droits réservés.