{"id":2,"date":"2021-01-18T19:06:24","date_gmt":"2021-01-18T19:06:24","guid":{"rendered":"http:\/\/orion.polito.it\/iolts\/?page_id=2"},"modified":"2022-07-22T08:33:58","modified_gmt":"2022-07-22T06:33:58","slug":"sample-page","status":"publish","type":"page","link":"https:\/\/orion.polito.it\/iolts\/","title":{"rendered":"Home"},"content":{"rendered":"\n

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The IEEE International Symposium on On-Line Testing and Robust System explores emerging trends and novel concepts related to all aspects of the robustness of microelectronic circuits and systems.<\/h2>\n\n\n\n
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The 2022 edition of IOLTS will be a hybrid event. Attendees will be able to join the conference in person in Torino or connect virtually through Zoom.<\/strong><\/p>\n\n\n\n

Submit your paper<\/a><\/p>\n\n\n\n

The program includes keynotes, scientific paper presentations, and special sessions.<\/p>\n\n\n\n

You are invited to participate and submit your contributions to IOLTS\u201922. The areas of interest include (but are not limited to) the following topics:<\/p>\n\n\n\n

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  • Dependable system design<\/li>
  • Dependable Computer Architectures<\/li>
  • Design-for-Reliability<\/li>
  • Design for Reliability approaches for Low-Power<\/li>
  • Cross-layer reliability approaches<\/li>
  • Fault-Tolerant and Fail-Safe systems<\/li>
  • Functional safety<\/li>
  • Self-Test and Self-Repair<\/li>
  • Self-Healing design<\/li>
  • Self-Regulating design<\/li>
  • Self-Adapting design<\/li>
  • Reliability issues of Low-Power Design<\/li>
  • Robustness evaluation<\/li>
  • Quality, yield, reliability and lifespan issues in nanometer technologies<\/li><\/ul>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
    \n
    • Variability, Aging, EMI, and Radiation Effects in nanometer technologies<\/li>
    • On-line testing techniques for digital, analog and mixed-signal circuits<\/li>
    • Self-checking circuits and coding theory<\/li>
    • On-line monitoring of current, temperature, process variations, and aging<\/li>
    • Power density and overheating issues in nanometer technologies<\/li>
    • Field Diagnosis, Maintainability, and Reconfiguration<\/li>
    • Design for Security<\/li>
    • Fault-based attacks and counter measures<\/li>
    • Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular and satellite communications<\/li>
    • CAD for robust circuits design<\/li><\/ul>\n<\/div>\n<\/div>\n\n\n\n

      <\/p>\n","protected":false},"excerpt":{"rendered":"

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