{"id":42,"date":"2021-01-28T13:35:51","date_gmt":"2021-01-28T13:35:51","guid":{"rendered":"http:\/\/orion.polito.it\/iolts\/?page_id=42"},"modified":"2022-07-11T10:36:56","modified_gmt":"2022-07-11T08:36:56","slug":"authors-reviewers","status":"publish","type":"page","link":"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/","title":{"rendered":"Authors"},"content":{"rendered":"\n<h2>Paper submission<\/h2>\n\n\n\n<p>We welcome your paper submission through our external submission website. You can access it by clicking on the submission button.<\/p>\n\n\n\n<p><a href=\"https:\/\/welcome.molesystems.com\/tttc\/IOLTS\/2022\/login.php\">Submit your paper<\/a><\/p>\n\n\n\n<p>Click&nbsp;<a rel=\"noreferrer noopener\" href=\"http:\/\/www.ieee.org\/conferences_events\/conferences\/publishing\/templates.html\" target=\"_blank\">HERE<\/a>&nbsp;to download MS word o latex templates.<\/p>\n\n\n\n<p>The IOLTS Program Committee invites&nbsp;<strong>original, unpublished, and not currently under review submissions<\/strong>&nbsp;for IOLTS 2022.<\/p>\n\n\n\n<p>Submitted papers must be complete manuscripts, up to six pages (<strong>the references do not count towards the page limit<\/strong> <strong>and<\/strong> <strong>references don\u2019t have page limits<\/strong>) in a standard IEEE two-column format. Papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.<\/p>\n\n\n\n<h2>Proposals for special sessions<\/h2>\n\n\n\n<p>Proposals for special sessions are also welcomed. Special sessions may include presentations on hot topics, panels, and embedded tutorials. Every proposal must include a 150-to-200 word abstract, the name of the organizers, and a list of at least three speakers with a tentative presentation title that should be submitted by email to the Special Session chair, Marcello Traiola (<a href=\"mailto:marcello.traiola@inria.fr\">marcello.traiola@inria.fr<\/a>). <\/p>\n\n\n<div class=\"wp-block-image is-style-rounded\">\n<figure class=\"aligncenter size-full is-resized\"><img decoding=\"async\" src=\"http:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/04\/marcello-inria-face-linkedin-e1650459772862.jpg\" alt=\"\" class=\"wp-image-299\" width=\"163\" height=\"163\"\/><\/figure><\/div>\n\n\n<div class=\"is-layout-flex wp-container-2 wp-block-columns\">\n<div class=\"is-layout-flow wp-block-column\">\n<p class=\"has-text-align-center\"><strong>Marcello Traiola<\/strong><br>Inria \/ IRISA laboratory &#8211; University of Rennes, Rennes, France<br>(<a href=\"mailto:marcello.traiola@inria.fr\">marcello.traiola@inria.fr<\/a>)<\/p>\n<\/div>\n<\/div>\n\n\n\n<p>If the proposal for the special session is accepted, the speakers will be invited to prepare a paper to be included in the formal proceedings of the conference.<\/p>\n\n\n\n<h2>Key Dates<\/h2>\n\n\n\n<ul><li><strong>Title and Abstract registration:<\/strong> <strong>May 23rd, 2022 (Hard deadline)<\/strong><\/li><li><strong>Paper submission<\/strong>:\u00a0\u00a0<del>May 23rd, 2022<\/del> <strong>May 27th, 2022<\/strong> <strong>(Hard deadline)<\/strong><\/li><li><strong>Notification of acceptance:<\/strong> June 27th, 2022<\/li><li><strong>Camera-ready upload:<\/strong> July 22nd, 2022<\/li><\/ul>\n\n\n\n<p>For submission related information, please contact the&nbsp;<strong>Program Chairs<\/strong>:<\/p>\n\n\n\n<div class=\"is-layout-flex wp-container-5 wp-block-columns\">\n<div class=\"is-layout-flow wp-block-column\"><div class=\"wp-block-image is-style-rounded\">\n<figure class=\"aligncenter size-thumbnail\"><img decoding=\"async\" width=\"150\" height=\"150\" src=\"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Paolo-Rech-1-150x150.jpeg\" alt=\"\" class=\"wp-image-272\" srcset=\"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Paolo-Rech-1-150x150.jpeg 150w, https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Paolo-Rech-1-300x300.jpeg 300w, https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Paolo-Rech-1-1024x1024.jpeg 1024w, https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Paolo-Rech-1-768x768.jpeg 768w, https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Paolo-Rech-1-1536x1536.jpeg 1536w, https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Paolo-Rech-1.jpeg 1557w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/figure><\/div>\n\n\n<p class=\"has-text-align-center\"><strong>Paolo Rech<\/strong><br>University of Trento, Trento, Italy<br>(<a href=\"mailto:dan.alexandrescu@iroctech.com\">paolo.rech@unitn.it<\/a>)<\/p>\n<\/div>\n\n\n\n<div class=\"is-layout-flow wp-block-column\"><div class=\"wp-block-image is-style-rounded\">\n<figure class=\"aligncenter size-thumbnail\"><img decoding=\"async\" width=\"150\" height=\"150\" src=\"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Alessandro_Savino-150x150.jpeg\" alt=\"\" class=\"wp-image-273\" srcset=\"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Alessandro_Savino-150x150.jpeg 150w, https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/03\/Alessandro_Savino.jpeg 225w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/figure><\/div>\n\n\n<p class=\"has-text-align-center\"><strong>Alessandro Savino<\/strong><br>Politecnico di Torino, Torino, Italy<br>(<a href=\"mailto:dgizop@di.uoa.gr\">alessandro.savino@polito.it<\/a>)<\/p>\n<\/div>\n<\/div>\n\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Paper submission We welcome your paper submission through our external submission website. You can access it by clicking on the&hellip;<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v20.1 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Authors - The 28th IEEE International Symposium on On-Line Testing and Robust System Design<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Authors - The 28th IEEE International Symposium on On-Line Testing and Robust System Design\" \/>\n<meta property=\"og:description\" content=\"Paper submission We welcome your paper submission through our external submission website. You can access it by clicking on the&hellip;\" \/>\n<meta property=\"og:url\" content=\"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/\" \/>\n<meta property=\"og:site_name\" content=\"The 28th IEEE International Symposium on On-Line Testing and Robust System Design\" \/>\n<meta property=\"article:modified_time\" content=\"2022-07-11T08:36:56+00:00\" \/>\n<meta property=\"og:image\" content=\"http:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/04\/marcello-inria-face-linkedin-e1650459772862.jpg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Estimated reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/\",\"url\":\"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/\",\"name\":\"Authors - The 28th IEEE International Symposium on On-Line Testing and Robust System Design\",\"isPartOf\":{\"@id\":\"https:\/\/orion.polito.it\/iolts\/#website\"},\"datePublished\":\"2021-01-28T13:35:51+00:00\",\"dateModified\":\"2022-07-11T08:36:56+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/#breadcrumb\"},\"inLanguage\":\"en-GB\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/orion.polito.it\/iolts\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Authors\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/orion.polito.it\/iolts\/#website\",\"url\":\"https:\/\/orion.polito.it\/iolts\/\",\"name\":\"The 28th IEEE International Symposium on On-Line Testing and Robust System Design\",\"description\":\"IOLTS 2022\",\"publisher\":{\"@id\":\"https:\/\/orion.polito.it\/iolts\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/orion.polito.it\/iolts\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"en-GB\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/orion.polito.it\/iolts\/#organization\",\"name\":\"The 28th IEEE International Symposium on On-Line Testing and Robust System Design\",\"url\":\"https:\/\/orion.polito.it\/iolts\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\/\/orion.polito.it\/iolts\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2021\/01\/IOLTS.png\",\"contentUrl\":\"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2021\/01\/IOLTS.png\",\"width\":250,\"height\":50,\"caption\":\"The 28th IEEE International Symposium on On-Line Testing and Robust System Design\"},\"image\":{\"@id\":\"https:\/\/orion.polito.it\/iolts\/#\/schema\/logo\/image\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Authors - The 28th IEEE International Symposium on On-Line Testing and Robust System Design","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/","og_locale":"en_GB","og_type":"article","og_title":"Authors - The 28th IEEE International Symposium on On-Line Testing and Robust System Design","og_description":"Paper submission We welcome your paper submission through our external submission website. You can access it by clicking on the&hellip;","og_url":"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/","og_site_name":"The 28th IEEE International Symposium on On-Line Testing and Robust System Design","article_modified_time":"2022-07-11T08:36:56+00:00","og_image":[{"url":"http:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2022\/04\/marcello-inria-face-linkedin-e1650459772862.jpg"}],"twitter_card":"summary_large_image","twitter_misc":{"Estimated reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/","url":"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/","name":"Authors - The 28th IEEE International Symposium on On-Line Testing and Robust System Design","isPartOf":{"@id":"https:\/\/orion.polito.it\/iolts\/#website"},"datePublished":"2021-01-28T13:35:51+00:00","dateModified":"2022-07-11T08:36:56+00:00","breadcrumb":{"@id":"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/#breadcrumb"},"inLanguage":"en-GB","potentialAction":[{"@type":"ReadAction","target":["https:\/\/orion.polito.it\/iolts\/authors-reviewers\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/orion.polito.it\/iolts\/authors-reviewers\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/orion.polito.it\/iolts\/"},{"@type":"ListItem","position":2,"name":"Authors"}]},{"@type":"WebSite","@id":"https:\/\/orion.polito.it\/iolts\/#website","url":"https:\/\/orion.polito.it\/iolts\/","name":"The 28th IEEE International Symposium on On-Line Testing and Robust System Design","description":"IOLTS 2022","publisher":{"@id":"https:\/\/orion.polito.it\/iolts\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/orion.polito.it\/iolts\/?s={search_term_string}"},"query-input":"required name=search_term_string"}],"inLanguage":"en-GB"},{"@type":"Organization","@id":"https:\/\/orion.polito.it\/iolts\/#organization","name":"The 28th IEEE International Symposium on On-Line Testing and Robust System Design","url":"https:\/\/orion.polito.it\/iolts\/","logo":{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/orion.polito.it\/iolts\/#\/schema\/logo\/image\/","url":"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2021\/01\/IOLTS.png","contentUrl":"https:\/\/orion.polito.it\/iolts\/wp-content\/uploads\/2021\/01\/IOLTS.png","width":250,"height":50,"caption":"The 28th IEEE International Symposium on On-Line Testing and Robust System Design"},"image":{"@id":"https:\/\/orion.polito.it\/iolts\/#\/schema\/logo\/image\/"}}]}},"_links":{"self":[{"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/pages\/42"}],"collection":[{"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/comments?post=42"}],"version-history":[{"count":27,"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/pages\/42\/revisions"}],"predecessor-version":[{"id":321,"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/pages\/42\/revisions\/321"}],"wp:attachment":[{"href":"https:\/\/orion.polito.it\/iolts\/wp-json\/wp\/v2\/media?parent=42"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}