{"id":205,"date":"2021-06-08T13:26:10","date_gmt":"2021-06-08T11:26:10","guid":{"rendered":"http:\/\/orion.polito.it\/iolts\/?page_id=205"},"modified":"2024-06-14T13:27:53","modified_gmt":"2024-06-14T11:27:53","slug":"registration","status":"publish","type":"page","link":"https:\/\/orion.polito.it\/iolts\/registration\/","title":{"rendered":"Registration"},"content":{"rendered":"\n

At least one full registration<\/span> must be associated with each accepted<\/b><\/b> paper\/poster – i.e., if the only author registered for a paper is a student\/life member, the reduced fee does not apply<\/span><\/b>.<\/p>\n\n\n\n

Author registration<\/span><\/b> deadline: May 25, 2024<\/strong>.<\/span><\/b><\/p>\n\n\n\n

Early registration deadline:<\/span> May 31,<\/s> June 20, 2024<\/span>.<\/strong><\/p>\n\n\n\n

For any registration questions, please contact both General Chairs.<\/p>\n\n\n\n

\n
<\/i> REGISTER NOW <\/i><\/a><\/div>\n<\/div>\n\n\n\n

Fees<\/h2>\n\n\n\n

Author Registration<\/h3>\n\n\n\n
IEEE Member<\/td>Non Member<\/td><\/tr>
$480.00<\/strong><\/td>$575.00<\/strong><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

Conference Registration<\/h3>\n\n\n\n
IEEE Student\/Life Member
$370.00
<\/strong>Changes to\u00a0$445.00<\/strong>\u00a0by Thursday, June 20, 2024<\/td>
Student Non Member
$450.00<\/strong>
Changes to\u00a0$530.00<\/strong>\u00a0by Thursday, June 20, 2024<\/td><\/tr>
IEEE Member
$480.00<\/strong>
Changes to\u00a0$575.00<\/strong> by Thursday, June 20, 2024<\/td>
Non Member
$575.00<\/strong>
Changes to\u00a0$690.00<\/strong>\u00a0by Thursday, June 20, 2024<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

One-Day Ticket<\/h3>\n\n\n\n
IEEE Member<\/td>Non Member<\/td><\/tr>
$160.00
<\/strong>Changes to\u00a0$190.00<\/strong>\u00a0by Thursday, June 20, 2024<\/td>
$190.00
<\/strong>Changes to\u00a0$230.00<\/strong>\u00a0by Thursday, June 20, 2024<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

Extra Social Event Ticket<\/h3>\n\n\n\n

$110.00<\/strong><\/p>\n\n\n\n

Author Conference Registration Includes:<\/strong> Presentation and publication of one (1) paper<\/strong>, technical sessions, proceedings and Program Booklet, coffee breaks, lunches (all days), Welcome Reception (Wednesday), Social Event and Gala Dinner (Thursday)<\/p>\n\n\n\n

Conference Registration Includes:<\/strong> Technical sessions, proceedings and Program Booklet, coffee breaks, lunches (all days), Welcome Reception (Wednesday), Social Event and Gala Dinner (Thursday)<\/p>\n\n\n\n

One Day Registration Includes:<\/strong> Technical sessions (of that day), proceedings and Program Booklet, coffee breaks (of that day), lunch (of that day), Welcome Reception (if registered for Wednesday)<\/p>\n\n\n\n

\n
<\/i> REGISTER NOW <\/i><\/a><\/div>\n<\/div>\n\n\n\n
\n","protected":false},"excerpt":{"rendered":"

At least one full registration must be associated with each accepted paper\/poster – i.e., if the only author registered for…<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-205","page","type-page","status-publish","hentry"],"yoast_head":"\nRegistration - The 30th IEEE International Symposium on On-Line Testing and Robust System Design<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/orion.polito.it\/iolts\/registration\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Registration - The 30th IEEE International Symposium on On-Line Testing and Robust System Design\" \/>\n<meta property=\"og:description\" content=\"At least one full registration must be associated with each accepted paper\/poster – i.e., if the only author registered for…\" \/>\n<meta property=\"og:url\" content=\"https:\/\/orion.polito.it\/iolts\/registration\/\" \/>\n<meta property=\"og:site_name\" content=\"The 30th IEEE International Symposium on On-Line Testing and Robust System Design\" \/>\n<meta property=\"article:modified_time\" content=\"2024-06-14T11:27:53+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/orion.polito.it\/iolts\/registration\/\",\"url\":\"https:\/\/orion.polito.it\/iolts\/registration\/\",\"name\":\"Registration - 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