{"id":2,"date":"2023-03-09T13:58:57","date_gmt":"2023-03-09T12:58:57","guid":{"rendered":"http:\/\/orion.polito.it\/iolts\/?page_id=2"},"modified":"2025-07-02T18:08:35","modified_gmt":"2025-07-02T16:08:35","slug":"iolts-2","status":"publish","type":"page","link":"https:\/\/orion.polito.it\/iolts\/","title":{"rendered":"IEEE IOLTS 2025"},"content":{"rendered":"\n

The IEEE International Symposium on On-Line Testing and Robust System Design explores emerging trends and novel concepts related to all aspects of the robustness of microelectronic circuits and systems.<\/h2>\n\n\n\n
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The 2025 edition of IOLTS will be a full in-person event organized in Ischia island (Naples region), Italy, from July 7 to July 9, 2025. <\/strong><\/p>\n\n\n\n

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<\/i> Guidelines for presenters <\/i> <\/a><\/div><\/br>\n\n\n\n
<\/i> Register to IOLTS 25! <\/i> <\/a><\/div><\/br>\n<\/div>\n\n\n\n

<\/p>\n\n\n\n

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<\/i> Hotel special prices <\/i> <\/a><\/div><\/br>\n<\/div><\/div>\n<\/div>\n\n\n\n
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<\/i> Call for Project dissemination <\/i> <\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
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<\/i> Camera-ready instructions <\/i> <\/a><\/div><\/br>\n\n\n\n
<\/i> Download the Call for Paper <\/i> <\/a><\/div><\/br>\n<\/div>\n\n\n\n
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<\/i> The best accepted papers of IOLTS 2025 will be invited to submit extended versions for an IEEE <\/b><\/mark>Transactions on Device and Materials Reliability (TDMR) special issue dedicated to IOLTS 2025<\/mark><\/strong><\/h4>\n\n\n\n

The program includes keynotes, scientific paper presentations, and special sessions.<\/p>\n\n\n\n

You are invited to participate and submit your contributions to IOLTS\u201925. The areas of interest include (but are not limited to) the following topics:<\/p>\n\n\n\n

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  • Dependable system design<\/li>\n\n\n\n
  • Dependable Computer Architectures<\/li>\n\n\n\n
  • Design-for-Reliability<\/li>\n\n\n\n
  • Design for Reliability approaches for Low-Power<\/li>\n\n\n\n
  • Cross-layer reliability approaches<\/li>\n\n\n\n
  • Fault-Tolerant and Fail-Safe systems<\/li>\n\n\n\n
  • Functional safety<\/li>\n\n\n\n
  • Self-Test and Self-Repair<\/li>\n\n\n\n
  • Self-Healing design<\/li>\n\n\n\n
  • Self-Regulating design<\/li>\n\n\n\n
  • Self-Adapting design<\/li>\n\n\n\n
  • Reliability issues of Low-Power Design<\/li>\n\n\n\n
  • Robustness evaluation<\/li>\n\n\n\n
  • Quality, yield, reliability, and lifespan issues in nanometer technologies<\/li>\n<\/ul>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
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    • Variability, Aging, EMI, and Radiation Effects in nanometer technologies<\/li>\n\n\n\n
    • On-line testing techniques for digital, analog, and mixed-signal circuits<\/li>\n\n\n\n
    • Self-checking circuits and coding theory<\/li>\n\n\n\n
    • On-line monitoring of current, temperature, process variations, and aging<\/li>\n\n\n\n
    • Power density and overheating issues in nanometer technologies<\/li>\n\n\n\n
    • Field Diagnosis, Maintainability, and Reconfiguration<\/li>\n\n\n\n
    • Design for Security<\/li>\n\n\n\n
    • Fault-based attacks and countermeasures<\/li>\n\n\n\n
    • Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications<\/li>\n\n\n\n
    • CAD for robust circuits design<\/li>\n<\/ul>\n<\/div>\n<\/div>\n\n\n\n

      <\/p>\n","protected":false},"excerpt":{"rendered":"

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