General Chair
M. Nicolaidis,
iRoC Technologies
M. Abramovici,
Agere Systems
Program Chairs
M. Sonza Reorda,
Politec. di Torino
C. Metra,
U. Bologna
Vice General Chair
Y. Zorian,
LogicVision
R. Leveugle,
TIMA Laboratory
Vice Program Chair
D. Nikolos,
U. Patras
J. Hayes,
U. Michigan
Publicity
R. Velazco,
TIMA Laboratory
Publications
M. Violante,
Politec. di Torino
Local Chair
L. Anghel,
TIMA Laboratory
Financial Chair
A. Rambaud,
iRoC Technologies
Industrial Liaison
E. Dupont,
iRoC Technologies
ETTTC Liaison
C. Landrault,
LIRMM
Program Committee
J. Abraham,
U. Texas
E. Boehl,
Robert Bosch GmbH
C. Bolchini,
Politec. di Milano
A. Dandache,
U. Metz
J. Figueras,
U.P. de Catalunya
P. Girard,
LIRMM
D. Gizopoulos,
U. Piraeus
M. Goessel,
U. of Postdam
Th. Haniotakis,
U. Southern Illinois
A. Ivanov,
U. of Brit. Columbia
R. Iyer,
U. Illinois
D. Kagaris,
U. Southern Illinois
R. Kleihorst,
Philips
A. Krasniewski,
Warsaw U.T.
K. Kuchukian,
Armenian NAS
P.K. Lala,
U. of Arkansas
H. Levendel,
Motorola
I. Levin,
U. Tel Aviv
J.C. Lo,
U. Rhode Island
S. Mitra,
Stanford U.
Y. Maidon,
U. Bordeaux
H. Manhaeve,
QStar
A. Orailoglu,
U. of Cal. San Diego
A. Paschalis,
Athens U.
S. Piestrak,
iRoC Technologies
D. Pradhan,
U. Bristol
M. Rebaudengo,
Politec. di Torino
K. Roy,
Purdue U.
J. Segura,
U. Illes Balears
E. Simeu,
TIMA Laboratory
J. Sosnowski,
Warsaw U.T.
G. Stamoulis,
U. Crete
B. Straube,
Fraunhofer IIS/EAS
C.E. Stroud,
U.N. Carolina
N.A. Touba,
U. Texas
S. Tragoudas,
U. Southern Illinois
Y. Tsiatouhas,
ISD
F. Vargas,
PUCRS
H.T. Vierhaus,
Brandenburg T.U.
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Call For Participation
The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost-effective on-line test techniques. These needs are increased dramatically in the near future, since very deep submicron and nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in ICs. The workshop is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication.
The Workshop is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with Politecnico di Torino, TIMA, and IRoC Technologies (France).
The topics include (but are not limited to)
the following ones |
Coordinators |
 |
On-line test in the contineous operation of large systems |
H. Levendel, Motorola |
|
Field diagnosis, maintainability and reconfiguration |
M. Abramovici, Agere Systems |
|
Reliability issues in nanometer technologies |
M. Nicolaidis, iRoC Technologies
G. Stamoulis, U. Crete |
|
On-line testing of analog and mixed signal circuits |
J. Segura, U. Illes Balears |
|
Self-checking circuits and coding theory |
M. Goessel, Potsdam U.
A. Paschalis, Athens U. |
|
On-line and off-line BIST |
D. Gizopoulos, U. Piraeus
S. Tragoudas, U. Southern Illinois |
|
Synthesis of on-line testable circuits |
R. Leveugle, TIMA Laboratory |
|
Radiation effects |
R. Velazco, TIMA Laboratory |
|
Fault-tolerant and fail-safe Systems |
A. Orailoglu, U.Cal. San Diego |
|
On-line testing in automotive, railway, avionics and industrial control |
E. Boehl, Robert Bosch GmbH
S. Piestrak, iRoC Technologies |
|
On-line power monitoring and control |
K. Roy, Purdue U. |
|
Reliability evaluation |
M. Sonza Reorda, Politec. di Torino |
|
On-line monitoring of current, temperature and other reliability indicators |
A. Ivanov, U. British Columbia
H. Manhaeve, QStar |
Submissions:
All submissions should have a title page with the name, address, phone number, fax number, and e-mail address of a contact author. Authors of accepted papers will have the option of having their papers included in a formal Proceedings to be published by the IEEE. The title page of each submission should state whether or not the authors want the paper to be considered for publication in the Workshop Proceedings. To be included in the Proceedings, a full-length paper must be submitted by the submission deadline. Authors not wishing their work published in the Proceedings may submit either a full-length paper or an extended abstract.
The best papers of the workshop will be invited to be re-submitted for a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA), published by Kluwer Academic Publishers.
Please observe the following deadlines:
 |
Submission deadline: |
February 18, 2002 |
| Notification of acceptance: |
March 23, 2002 |
General Information:
Miron Abramovici
Circuits and Systems Research Lab.
Agere Systems
600 Mountain Ave Rm. 2C-225
Murray Hill, NJ 07974-0636
USA
Tel.: +1 908 582 3933
Fax: +1 908 582 4092 |
|
Michael Nicolaidis
iRoC Technologies
World Trade Center
BP 1510
38025 Grenoble Cedex
France
Tel.: +33 4 3812 0763
Fax: +33 4 3812 9615 |
About the location:
The Workshop will be held in the beautiful island of Bendor in the Delos Hotel.
The Island is a very small island (7ha.) located in front of Bandol French Riviera coast close to Marseille and Toulon. This island has kept all the charming attractive sides of small Provencal houses and luxuriant gardens where life is worth living (there are no cars).
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