The IEEE International Symposium on On-Line Testing and Robust System explores emerging trends and novel concepts related to all aspects of the robustness of microelectronic circuits and systems.

The 2022 edition of IOLTS will be a hybrid event. Attendees will be able to join the conference in person in Torino or connect virtually through Zoom.

Submit your paper

The program includes keynotes, scientific paper presentations, and special sessions.

You are invited to participate and submit your contributions to IOLTS’22. The areas of interest include (but are not limited to) the following topics:

  • Dependable system design
  • Dependable Computer Architectures
  • Design-for-Reliability
  • Design for Reliability approaches for Low-Power
  • Cross-layer reliability approaches
  • Fault-Tolerant and Fail-Safe systems
  • Functional safety
  • Self-Test and Self-Repair
  • Self-Healing design
  • Self-Regulating design
  • Self-Adapting design
  • Reliability issues of Low-Power Design
  • Robustness evaluation
  • Quality, yield, reliability and lifespan issues in nanometer technologies
  • Variability, Aging, EMI, and Radiation Effects in nanometer technologies
  • On-line testing techniques for digital, analog and mixed-signal circuits
  • Self-checking circuits and coding theory
  • On-line monitoring of current, temperature, process variations, and aging
  • Power density and overheating issues in nanometer technologies
  • Field Diagnosis, Maintainability, and Reconfiguration
  • Design for Security
  • Fault-based attacks and counter measures
  • Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular and satellite communications
  • CAD for robust circuits design