All sessions are scheduled according to the local time.

Time July 3 July 4 July 5
8:00 – 8:30 Registration & Welcome Desk
8:30 – 8:45 Registration & Welcome Desk Registration & Welcome Desk
8:45 – 9:00 Opening Session
9:00 – 10:00 Keynote 1 Keynote 2 Regular Session 5 –
Testing and Reliability
10:00 – 10:15 Coffee Break Coffee Break Coffee Break
10:15 – 11:15 Regular Session 1 – Life-Cycle Management Issues Special Session 1 – From security to safety, trusting the next
generation of connected cars		 Regular Session 6 – Fault-Tolerant and Fail-Safe Systems
11:15 – 11:30 Coffee Break Coffee Break Coffee Break
11:30 – 12:30 Regular Session 2 – Dependable Computing Special Session 2 – Silicon Lifecycle Management Special Session 3 – Silent Data Corruptions in Computing:
Understand and Quantify
12:30 – 13:45 Lunch Break Lunch Break Lunch Break
13:45 – 14:00
14:00 – 15:00 Regular Session 3 – Security and Resilience Regular Session 7 – Robustness
15:00 – 15:15 Poster Session
Posters & Coffee 		Coffee Break
15:15 – 16:15 Regular Session 8 – Design-For-Reliability
16:15 – 16:30 Regular Session 4 – Design For Security Closing Session
16:30 – 17:35
19:00 – 21:00 Welcome Reception
21:00 – 23:00

July 3, 2024

08:00 – 08:45 Registration & Welcome Desk

08:45 – 09:00 Opening Session

09:00 – 10:00 Keynote 1: “DEPENDABILITY CHALLENGES AND SILICON LIFE CYCLE MANAGEMENT FOR EMERGING SOCS”

Jyotika Athavale – Synopsys (US), 2024 President of the IEEE Computer Society

Moderator: Angeliki KRITIKAKOU

More information on the keynote

10:00-10:15 Coffee Break

10:15 – 11:15 Regular Session 1 – Life-Cycle Management Issues

Moderator: Salvador MANICH BOU

  • On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories – Fabian VARGAS (IHP – Microelectronics), Vache GALSTYAN, Gurgen HARUTYUNYAN, Yervant ZORIAN (Synopsys)
  • A Graph-Based Methodology for Speeding up Cell-Aware Model Generation – Gianmarco MONGELLI (LIRMM, ST), Xhesila XHAFA (LIRMM), Eric FAEHN, Dylan ROBINS (ST), Patrick GIRARD, Arnaud VIRAZEL (LIRMM)
  • Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22nm FDSOI Latches – Zhe ZHANG (Karlsruhe Institute of Technology), Christian WEIS, Norbert WEHN (RPTU Kaiserslautern-Landau), Mehdi TAHOORI (Karlsruhe Institute of Technology), Sani NASSIF (Radyalis LLC)
    Presenter: Mahta Mayahinia (KIT)

11:15 – 11:30 Coffee Break

11:30 – 12:30 Regular Session 2 – Dependable Computing

Moderator: Fabian VARGAS

  • Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects – Michelangelo BARTOLOMUCCI, Nikolaos DELIGIANNIS, Riccardo CANTORO, Matteo SONZA REORDA (Politecnico di Torino)
  • Neutron Beam Evaluation of Probabilistic Data Structure-based Online Checkers – Bruno ENDRES FORLIN, Edian ANNINK, Elijah CISHUGI (University of Twente), Cazzaniga CARLO (Rutherford Appleton Laboratory-ISIS), Paolo RECH (University of Trento), Gerard RAUWERDA (Technolution B.V.), Gianluca FURANO (EUROPEAN SPACE AGENCY), Marco OTTAVI (Twente U.)
  • A synergistic fault tolerance framework for Mbit 28nm embedded RRAM – Papavramidou Panagiota (CEA Leti), Sebastien Ricavy (CEA Leti), Christopher Mounet (CEA Leti), Carine Jahan (CEA Leti), Niccolo Castellani (CEA Leti), François Andrieu (CEA Leti)

12:30 – 14:00 Lunch Break

14:00 – 15:00 Regular Session 3 – Security and Resilience

Moderator: Haralampos-G. STRATIGOPOULOS

  • Side-Channel Attack with Fault Analysis on Memristor-based Computation-in-Memory – Brojogopal SAPUI (Karlsruhe Institute of Technology, Germany), Sergej MESCHKOV (Karlsruhe Institute of Technology (KIT)), Mehdi TAHOORI (Karlsruhe Institute of Technology)
  • Combining Fault Simulation and Beam Data for CNN Error Rate Estimation on RISC-V Commercial Platforms – Fernando DOS SANTOS (INRIA), Marcello TRAIOLA (Inria), Angeliki KRITIKAKOU (Univ Rennes, INRIA, Irisa, IUF)
  • Double Adjacent Error Correction in RRAM Matrix Multiplication Using Weighted Checksums – Kenrick PINTO, Krishnaja KODALI, Abhishek DAS, Nur TOUBA (University of Texas at Austin)

15:00 – 16:15 Posters & Coffee Break

  1. Anomalous IoT Behavior Detection by Generated Power Waveforms with Hyper-parameter Tuning – Ryusei EDA, Kota HISAFURU, Nozomu TOGAWA (Waseda University)
  2. On Approaching Multivariate IC Pre-silicon Verification Using ML-based Adaptive Algorithms – Alecsandra RUSU (Technical University of Cluj-Napoca), Emilian Constantin DAVID (Infineon Technologies Bucharest, Romania), Marina TOPA (Technical University of Cluj-Napoca), Vasile GROSU (Gheorghe Asachi Technical University Iasi, Romania), Andi BUZO (Infineon), Georg PELZ (Infineon Technologies, Neubiberg, Germany)
  3. EISFINN: On the Role of Efficient Importance Sampling in Fault Injection Campaigns for Neural Network Robustness Analysis – Alessio COLUCCI (TUWien), Andreas STEININGER (TU Vienna), Muhammad SHAFIQUE (New York University Abu Dhabi (NYUAD))
  4. SBanTEM: A Novel Methodology for Sparse Band Tensors as Soft-Error Mitigation in Sparse Convolutional Neural Networks – Alessio COLUCCI (TUWien), Andreas STEININGER (TU Vienna), Muhammad SHAFIQUE (New York University Abu Dhabi (NYUAD))
  5. Modeling Clock Glitch Fault Injection Effects on a RISC-V Microcontroller – Ihab ALSHAER (Univ. Grenoble Alpes), Ahmed AL-KAF, Valentin EGLOFF (Univ. Grenoble Alpes, Grenoble INP, LCIS), Vincent BEROULLE (Univ. Grenoble Alpes)
  6. On Evaluating Test Response Obfuscation and Encryption Countermeasures – Gaurav KUMAR, Anjum RIAZ, Pardeep KUMAR, Yamuna PRASAD, Satyadev AHLAWAT (Indian Institute of Technology Jammu)
  7. On the Reliability of Clock Monitoring Units of Microcontrollers for Safety Critical Applications – Massimiliano ZHUPA, Matteo NALDI, Martin Eugenio OMANA, Cecilia METRA (University of Bologna)
  8. Assessing Robustness of Smart Systems via Multi-domain Analog Fault Simulation – Francesco TOSONI, Nicola DALL’ORA, Enrico FRACCAROLI (University of Verona), Sara VINCO (Politecnico di Torino), Franco FUMMI (University di Verona)
  9. Safety-Relevant AI-Based System Robustification with Neural Network Ensembles – Adrià ALDOMÀ, Axel BRANDO (Barcelona Supercomputing Center), JAUME ABELLA (Barcelona Supercomputing Center), Francisco J. CAZORLA (Barcelona Supercomputing Center, Spanish national Research Council)
  10. EU project posters

16:15 – 17:35 Regular Session 4 – Design for Security

Moderator: Emanuele VALEA

  • Camo-DNN: Layer Camouflaging to Protect DNNs against Timing Side-Channel Attacks – Mahya MORID AHMADI (Vienna University of Technology), Lilas ALRAHIS (New York University Abu Dhabi), Ozgur SINANOGLU (NYU-Abu Dhabi), Muhammad SHAFIQUE (New York University Abu Dhabi (NYUAD))
  • Refinement and Empirical Side-Channel Analysis of Inner Product Masking with Robust Error Detection – Anton MAIDL (German Aerospace Center (DLR)), Maël GAY (University of Stuttgart), Osnat KEREN (Bar-Ilan University), Ilia POLIAN (University of Stuttgart)
  • Hardware Accelerator for FIPS 202 Hash Functions in Post-Quantum Ready SoCs – Diamante Simone CRESCENZO (CEA List), Rafael CARRERA RODRIGUEZ (CEA List)), Riccardo ALIDORI (CEA List), Florent BRUGUIER (Universite de Montpellier), Emanuele VALEA (CEA List), Pascal BENOIT (Universite de Montpellier), ALBERTO BOSIO (Lyon Institute of Nanotechnology)
  • Investigating the Feasibility of eFPGA-based Hardware Patching – Anudeep DHARAVATHU, Benjamin TAN (University of Calgary)

19:00 – 21:00 Welcome Reception

Welcome Reception

July 4, 2024

08:30 – 09:00 Registration & Welcome Desk

09:00 – 10:00 Keynote 2: “FAULT-TOLERANT QUANTUM COMPUTING: WHERE ROBUSTNESS IS A REQUIREMENT, NOT A FEATURE”

Robert Wille – Technical University of Munich (DE), Chief Scientific Officer at the Software Competence Center Hagenberg (AT)

Moderator: Marcello TRAIOLA

More information on the keynote

10:00 – 10:15 Coffee Break

10:15 – 11:15 Special Session 1 – From security to safety, trusting the next generation of connected cars

This session is supported by the SERICS – Security and Rights in the CyberSpace and received funding from the European Union Next-GenerationEU (PIANO NAZIONALE DI RIPRESA E RESILIENZA (PNRR) – MISSIONE 4 COMPONENTE 2, INVESTIMENTO 1.3 – D.D. 1556 11/10/2022, PE00000014)

Organizer and Moderator: Stefano DI CARLO (Politecnico di Torino)

  • Navigating the road to automotive cybersecurity compliance – Franco Oberti (Dumarey Softronix), Fabrizio Abrate (Dumarey Automotive), Alessandro Savino (Politecnico di Torino), Filippo Parisi (Dumarey Softronix), and Stefano Di Carlo (Politecnico di Torino)
  • Can social media shape the security of next-generation connected vehicles? – Nicola Scarano (Politecnico di Torino), Franco Oberti (Dumarey Softronix), Luca Mannella (Politecnico di Torino), Alessandro Savino (Politecnico di Torino), and Stefano Di Carlo (Politecnico di Torino)
  • Functional Safety Challenges and Solutions in Automotive SoCs – Grigor Tshagharyan (Synopsis) , Gurgen Harutyunyan (Synopsis) , Yervant Zorian (Synopsis)

11:15 – 11:30 Coffee Break

11:30 – 12:30 Special Session 2 – Silicon Lifecycle Management

Organizer: Yervant ZORIAN (Synopsys, USA)

Moderator: Alberto BOSIO

Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessor’s Caches – M. Omana, A. Manfredi, C. Metra (University of Bologna, Italy), R. Locatelli, M. Chiavacci, S. Petrucci (Intel, Italy)

Advanced Silicon Lifecycle Management: Mitigating Manufacturing Defect to In-field Degradation – Yervant Zorian (Synopsys, USA)

Detection and Mitigation of SRAM Aging towards Silicon Lifecycle Management – Mahta Mayahinia, Mehdi Tahoori (KIT, Germany)

12:30 – 13:45 Lunch Break

13:45 – 14:00 Gathering at the buses

14:00 – 23:00 Social Event and Gala Dinner

More information on Social Event and Gala Dinner

July 5, 2024

08:30 – 09:00 Registration & Welcome Desk

09:00 – 10:00 Regular Session 5 – Testing and Reliability

Moderator: Yamuna PRASAD

  • Efficient Optimized Tests for Resistive RAM Based Convolutional Neural Networks – Anurup SAHA (Georgia Tech), Kwondo MA, Chandramouli AMARNATH, Abhijit CHATTERJEE (Georgia Institute of Technology)
  • Automatic High Functional Coverage Stimuli Generation for Assertion-based Verification – Hossein ROSTAMI, Mostafa HOSSEINI (University of Zanjan), Ali AZARPEYVAND, Mohammad Reza HEIDARI IMAN (Tallinn University of Technology), Tara GHASEMPOURI (Talinn University of Technology)
  • EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design – Roukoz NABHAN (Ecole Nationale Supérieure des Mines de Saint-Etienne), Jean-Max DUTERTRE (IMT), Jean-baptiste RIGAUD (ENSM-SE), Jean-Luc DANGER (Télécom Paris), Laurent SAUVAGE (Télécom Paris)

10:00 – 10:15 Coffee Break

10:15 – 11:15 Regular Session 6 – Fault-Tolerant and Fail-Safe Systems

Moderator: Bastien DEVEAUTOUR

  • VANDOR: Mitigating SEUs into Quantized Neural Networks – Wilfread GUILLEMÉ (Univ. Rennes, INRIA, IRISA), Angeliki KRITIKAKOU (Univ Rennes, INRIA, Irisa, IUF), Youri HELEN (DGA MI), CEDRIC KILLIAN (Université Jean Monnet Saint-Etienne), Daniel CHILLET (Univ Rennes, INRIA, Irisa)
  • Enhancing the reliability of Split Computing Deep Neural Networks – Giuseppe ESPOSITO, Juan GUERRERO, Josie RODRIGUEZ CONDIA (Politecnico di Torino), Marco LEVORATO (University of California Irvine), Matteo SONZA REORDA (Politecnico di Torino)
  • Zero-Overhead Dependable Design of Binary Neural Networks with Deliberately Quantized Parameters – Behnam GHAVMI, Mohammad SHAHIDZADEH ASADI, Lesley SHANNON (Simon Fraser University), Steven WILTON (University of British Columbia)

11:15 – 11:30 Coffee Break

11:30 – 12:30 Special Session 3 – Silent Data Corruptions in Computing: Understand and Quantify

Organizer and Moderator: Dimitris GIZOPOULOS

  • Effectively Using OpenDCDiag to Search for Defects – Thiago Macieira (Intel)
  • Online Testing in the Era of Marginal Defects – Sankaranarayanan Gurumurthy (AMD)
  • Sensor framework for predictive SDC maintenance – Amr Haggag (Arm)

12:30 – 14:00 Lunch Break

14:00 – 15:00 Regular Session 7 – Robustness

Moderator: Olivier SENTIEYS

  • Proton Evaluation of Single Event Effects in the NVIDIA GPU Orin SoM: Understanding Radiation Vulnerabilities Beyond the SoC – Ivan RODRIGUEZ-FERRANDEZ (Barcelona Supercomputer Center), Leonidas KOSMIDIS (Barcelona Supercomputing Center), Maris TALI, David STEENARI (European Space Agency), Alex HANDS, Camille BELANGER-CHAMPAGNE (TRIUMF)
  • Reliability of AI in Predicting the State of Health of Li-Ion Batteries – Sara CRETI, Martin Eugenio OMANA, Cecilia METRA (University of Bologna), Gianni BORELLI (Beghelli)
  • SpikingJET: Enhancing Fault Injection for Fully and Convolutional Spiking Neural Networks – Anil Bayram GOGEBAKAN, Enrico MAGLIANO, Alessio CARPEGNA, Annachiara RUOSPO, Alessandro SAVINO, Stefano DI CARLO (Politecnico di Torino)

15:00 – 15:15 Coffee Break

15:15 – 16:15 Regular Session 8 – Design-For-Reliability

Moderator: Cecilia METRA

  • Effective Application-level Error Modeling of Permanent Faults on AI Accelerators – Juan GUERRERO, Francesco PESSIA, Robert LIMAS SIERRA, Josie RODRIGUEZ CONDIA (Politecnico di Torino), Marco LEVORATO (University of California Irvine), Matteo SONZA REORDA (Politecnico di Torino)
  • On the Fine Tuning of RRAM Resistance Under Variability Using Current Pulses at SET – Vahab MAHBOUBI (Universitat Politècnica de Catalunya – Barcelona Tech (UPC)), Alvaro GOMEZ-PAU, Calomarde ANTONIO, Daniel ARUMI, Rosa RODRIGUEZ-MONTANES (UPC), Salvador MANICH (UPC – BarcelonaTech)
  • Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning – Mohammad Hasan AHMADILIVANI (Tallinn University of Technology), Seyedhamidreza MOUSAVI (Mälardalen University), Jaan RAIK (Tallinn University of Technology), Masoud DANESHTALAB (Mälardalen University), Maksim JENIHHIN (Tallinn University of Technology)

16:15 – 16:30 Closing Session